University of California, San Diego, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Scientific Instruments, 67451 [05-22150]
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Federal Register / Vol. 70, No. 214 / Monday, November 7, 2005 / Notices
Docket Number: 05–042. Applicant:
Georgia Institute of Technology, 711
Marietta St., Atlanta, GA 30332.
Instrument: Dual Beam SEM/FIB
Electron Microscope System, Model
Nova 200 Nanolab. Manufacturer: FEI
Company, The Netherlands. Intended
Use: The instrument is intended to be
used to improve understanding of
molecular mechanisms and functional
assemblies, initiate development of new
materials, and facilitate advances in
environmental analysis and detection.
New research and creative concepts will
include: (1) multifunctional scanning
nanoprobes and quantum cascade laser–
based sensing systems,(2) stimulated
surface chemistry using metal–
insulator-metal (MIM) devices
containing nano–scale field emission
arrays,(3) optically gated single
molecule transistors,(4) shape–
preserving chemical conversion of 3–D
bioclastic structures,(5) impedance
mapping AFM cantilever arrays and (6)
nanobelts as nanobiosensors, and
nanocantilevers. Application accepted
by Commissioner of Customs:
September 15, 2005.
Docket Number: 05–043. Applicant:
Massachusetts General Hospital, 55
Fruit Street, Boston, MA 02114.
Instrument: Electron Microscope, Model
JEM–1011. Manufacturer: JEOL Ltd.,
Japan. Intended Use: The instrument is
intended to be used by the professional
laboratory staff at Massachusetts
General Hospital for the advancement of
scientific knowledge relating to U.S.
government funded medical research
projects using electron microscopy,
electron microtomy and
ultracryomicrotomy techniques.
Application accepted by Commissioner
of Customs: September 12, 2005.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. 05–22151 Filed 11–4–05; 8:45 am]
Billing Code: 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
University of California, San Diego, et
al., Notice of Consolidated Decision on
Applications for Duty–Free Entry of
Scientific Instruments
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, 80 Stat. 897; 15 CFR part
301). Related records can be viewed
between 8:30 A.M. and 5:00 P.M. in
Suite 4100W, Franklin Court Building,
VerDate Aug<31>2005
16:38 Nov 04, 2005
Jkt 208001
U.S. Department of Commerce, 1099
14th Street, NW, Washington, D.C.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instruments described below, for such
purposes as each is intended to be used,
is being manufactured in the United
States.
Docket Number: 05–038. Applicant:
University of California, San Diego.
Instrument: Low–Temperature Ultra–
High Vacuum Scanning Tunneling
Microscope. Manufacturer: Omicron
NanoTechnology, GmbH, Germany.
Intended Use: See notice at 70 FR
54366, September 14, 2005. Reasons:
The foreign instrument provides: (1) a
scanning tunneling microscope (STM)
mounted inside a 4K liquid helium
reservoir (8-hour time between liquid
He refills), (2) operation at an
equilibrium temperature of 4 K
(including both tip and sample), (3) in–
situ sample manipulation and tip
transfer capabilities, (4) low drift rates
of 1.0 angstrom/hour (5) RMS vibration
amplitudes of <0.005 angstrom in a 300
Hz bandwidth and (6) sample surface
facing downwards during STM imaging
for easy dosing. Advice received from:
A university research laboratory for
advanced microstructures and devices.
Docket Number: 05–039. Applicant:
University of Wisconsin, Eau Claire.
Instrument: Automatic Fusion Machine,
Model Autofluxer 4. Manufacturer:
Breitlander, GmbH, Germany. Intended
Use: See notice at 70 FR . Reasons: The
foreign instrument provides dissolution
of whole rock powder by a combination
fusion/acid digestion for trace element
analysis by ICP mass spectrometry. No
apparatus of equivalent scientific value
to the foreign apparatus, for such
purposes as it is intended to be used, is
being manufactured in the United
States. This is a compatible accessory
for an existing instrument purchased for
the use of the applicant. The accessory
is pertinent to the intended uses and we
know of no domestic accessory which
can be readily adapted for use with the
existing instrument.
Docket Number: 05–040. Applicant:
National Renewable Energy Laboratory,
Golden, CO, 80401. Instrument: Dual
Beam Focused Ion Beam Electron
Microscope, Model Nova 200 NanoLab.
Manufacturer: FEI Company, The
Netherlands. Intended Use: See notice at
70 FR 54366, September 14, 2005.
Reasons: The foreign instrument is an
electron microscope and is intended for
research or scientific educational uses
requiring it. We know of no instrument
suited to these purposes, which was
being manufactured in the United States
at the time of order of the instrument.
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67451
We know of no other instrument or
apparatus being manufactured in the
United States which is of equivalent
scientific value to any of the foreign
instruments.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. 05–22150 Filed 11–4–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
(A–570–803)
Heavy Forged Hand Tools (i.e., Axes &
Adzes, Bars & Wedges, Hammers &
Sledges, and Picks & Mattocks) from
the People’s Republic of China: Final
Results of the Expedited Sunset
Review of the Antidumping Duty
Orders
Import Administration,
International Trade Administration,
Department of Commerce.
SUMMARY: On July 1, 2005, the
Department of Commerce (‘‘the
Department’’) initiated a sunset review
of the antidumping duty (‘‘AD’’) orders
on Heavy Forged Hand Tools (i.e., Axes
& Adzes, Bars & Wedges, Hammers &
Sledges, and Picks & Mattocks)
(‘‘HFHTs’’) from the People’s Republic
of China pursuant to section 751(c) of
the Tariff Act of 1930, as amended (‘‘the
Act’’). On the basis of notices of intent
to participate and adequate substantive
responses filed on behalf of the
domestic interested parties and lack of
response from respondent interested
parties, the Department conducted an
expedited sunset review of the AD
orders pursuant to section 751(c)(3)(B)
of the Act and section
351.218(e)(1)(ii)(C)(2) of the
Department’s regulations. As a result of
this sunset review, the Department finds
that revocation of the AD orders would
likely lead to continuation or recurrence
of dumping at the levels indicated in the
‘‘Final Results of Review’’ section of this
notice.
EFFECTIVE DATE: November 7, 2005.
FOR FURTHER INFORMATION CONTACT:
Maureen Flannery, AD/CVD Operations,
Import Administration, International
Trade Administration, U.S. Department
of Commerce, 14th Street and
Constitution Avenue, NW, Washington,
DC 20230; telephone: (202) 482–3020.
SUPPLEMENTARY INFORMATION:
AGENCY:
Background
On July 1, 2005, the Department
initiated a sunset review of the AD
E:\FR\FM\07NON1.SGM
07NON1
]]>Agencies
[Federal Register Volume 70, Number 214 (Monday, November 7, 2005)]
[Notices]
[Page 67451]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 05-22150]
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DEPARTMENT OF COMMERCE
International Trade Administration
University of California, San Diego, et al., Notice of
Consolidated Decision on Applications for Duty-Free Entry of Scientific
Instruments
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court
Building, U.S. Department of Commerce, 1099 14th Street, NW,
Washington, D.C.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instruments described below,
for such purposes as each is intended to be used, is being manufactured
in the United States.
Docket Number: 05-038. Applicant: University of California, San
Diego. Instrument: Low-Temperature Ultra-High Vacuum Scanning Tunneling
Microscope. Manufacturer: Omicron NanoTechnology, GmbH, Germany.
Intended Use: See notice at 70 FR 54366, September 14, 2005. Reasons:
The foreign instrument provides: (1) a scanning tunneling microscope
(STM) mounted inside a 4K liquid helium reservoir (8-hour time between
liquid He refills), (2) operation at an equilibrium temperature of 4 K
(including both tip and sample), (3) in-situ sample manipulation and
tip transfer capabilities, (4) low drift rates of 1.0 angstrom/hour (5)
RMS vibration amplitudes of <0.005 angstrom in a 300 Hz bandwidth and
(6) sample surface facing downwards during STM imaging for easy dosing.
Advice received from: A university research laboratory for advanced
microstructures and devices.
Docket Number: 05-039. Applicant: University of Wisconsin, Eau
Claire. Instrument: Automatic Fusion Machine, Model Autofluxer 4.
Manufacturer: Breitlander, GmbH, Germany. Intended Use: See notice at
70 FR . Reasons: The foreign instrument provides dissolution of whole
rock powder by a combination fusion/acid digestion for trace element
analysis by ICP mass spectrometry. No apparatus of equivalent
scientific value to the foreign apparatus, for such purposes as it is
intended to be used, is being manufactured in the United States. This
is a compatible accessory for an existing instrument purchased for the
use of the applicant. The accessory is pertinent to the intended uses
and we know of no domestic accessory which can be readily adapted for
use with the existing instrument.
Docket Number: 05-040. Applicant: National Renewable Energy
Laboratory, Golden, CO, 80401. Instrument: Dual Beam Focused Ion Beam
Electron Microscope, Model Nova 200 NanoLab. Manufacturer: FEI Company,
The Netherlands. Intended Use: See notice at 70 FR 54366, September 14,
2005. Reasons: The foreign instrument is an electron microscope and is
intended for research or scientific educational uses requiring it. We
know of no instrument suited to these purposes, which was being
manufactured in the United States at the time of order of the
instrument.
We know of no other instrument or apparatus being manufactured in
the United States which is of equivalent scientific value to any of the
foreign instruments.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 05-22150 Filed 11-4-05; 8:45 am]
BILLING CODE 3510-DS-S
