State University of New York, Stony Brook, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 61603-61604 [E5-5893]
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Federal Register / Vol. 70, No. 205 / Tuesday, October 25, 2005 / Notices
purpose and (2) it knows of no domestic
instrument or apparatus of equivalent
scientific value to the foreign
instrument for the applicant’s intended
use.
We know of no other instrument or
apparatus of equivalent scientific value
to the foreign instrument which is being
manufactured in the United States.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs
Staff.
[FR Doc. E5–5895 Filed 10–24–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty–Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and, Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether an instrument of
equivalent scientific value, for the
purposes for which the instrument
shown below is intended to be used, is
being manufactured in the United
States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce, Washington,
D.C. 20230. Applications may be
examined between 8:30 A.M. and 5:00
P.M. in Suite 4100W, U.S. Department
of Commerce, Franklin Court Building,
1099 14th Street, NW, Washington, D.C.
Docket Number: 05–037. Applicant:
California Institute of Technology, 1200
E. California Blvd., Pasadena, CA 91125.
Instrument: Dual Beam SEM/FIB
System, Model 200 Nanolab.
Manufacturer: FEI Company, The
Netherlands. Intended Use: The
instrument is intended to be used to
modify and analyze delicate nano–
devices as well as to prepare more
conventional cross-sectional thin
sections for analytical electron
microscopy. The nanostructures to be
modified will largely be developed
within Caltech’s microfabrication
facilitiesand the delivered software
system will be re–written to enable
more precise patterning and alignment
of nanostructures. Metallorganic gases
can be delivered to the sample surface
through a gas manifold for metal
deposition and etching gases can be
injected to perform chemically–assisted
focused ion etching. A laser
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15:53 Oct 24, 2005
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interferometer stage will enable the
alignment of nanostructures to existing
alignment marks for a flexible
nanofabrication system. A large variety
of chemical analysis sensors will further
extend the capabilities of the
system.Application accepted by
Commissioner of Customs: September
27, 2005.
Docket Number: 05–044. Applicant:
Tufts University, 169 Holland Street,
Somerville, MA 02144. Instrument:
Low-temperature Scanning Tunneling
Microscope. Manufacturer: Omicron
Nanotechnology, Germany. Intended
Use: The instrument is intended to be
used to study molecules adsorbed on
metal and semiconductor surfaces at
low temperature to gain understanding
of the physisorption and chemisorption
processes. The research is intended to:
(1) obtain high–resolution images of
moleculesadsorbed on surfaces at
temperatures down to 4 Kelvin, (2)
record conductance and vibrational data
from these systems using the
microscope’s spectroscopic capabilities
and (3) manipulate the positions of
molecules using the microscope tip.
Application accepted by Commissioner
of Customs: October 5, 2005.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs
Staff.
[FR Doc. E5–5896 Filed 10–24–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
Princeton University, Notice of
Decision on Application for Duty–Free
Entry of Scientific Instrument
This decision is made pursuant to
Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 A.M. and 5:00 P.M. in Suite
4100W, U.S. Department of Commerce,
Franklin Court Building, 1099 14th
Street, NW, Washington, D.C.
Docket Number: 05–035. Applicant:
Princeton University, Princeton, New
Jersey. Instrument: Geiger Mode
Ionizing Counters (1350). Manufacturer:
pol.hi.tech, S.R.I, Italy. Intended Use:
See notice at 70 FR 48372, August 17,
2005.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as it is
intended to be used, is being
manufactured in the United States.
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61603
Reasons: These are compatible
accessories for an existing instrument.
Also referred to as limited streamer
tubes, they are to be interfaced to the
Stanford Linear Accelerator to study all
the systematics of B meson decay
processes by international research
projects. Extreme reliability is an
essential feature, since once assembled,
they cannot be removed for
replacement. The only domestic
assembly facility for producing large
numbers of these devices (at the
University of Houston) has been
decommissioned. The accessories are
pertinent to the intended uses and we
know of no domestic accessories which
can be readily adapted for this purpose.
We know of no other instrument or
apparatus of equivalent scientific value
which is being manufactured in the
United States.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs
Staff.
[FR Doc. E5–5894 Filed 10–24–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
State University of New York, Stony
Brook, et al., Notice of Consolidated
Decision on Applications for Duty–
Free Entry of Electron Microscopes
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, 80 Stat. 897; 15 CFR part
301). Related records can be viewed
between 8:30 A.M. and 5:00 P.M. in
Suite 4100W, Franklin Court Building,
U.S. Department of Commerce, 1099
14th Street, NW, Washington, D.C.
Docket Number: 05–032. Applicant:
State University of New York, Stony
Brook. Instrument: Electron Microscope,
Model JEM–2200FS. Manufacturer:
JEOL Ltd., Japan. Intended Use: See
notice at 70 FR 48372, August 17, 2005.
Order Date: September 2, 2003.
Docket Number: 05–034. Applicant:
The University of Southern Mississippi,
Hattiesburg. Instrument: Electron
Microscope, Model JEM–2100.
Manufacturer: JEOL, Ltd., Japan.
Intended Use:See notice at 70 FR 48372,
August 17, 2005. Order Date: October
13, 2004.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
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61604
Federal Register / Vol. 70, No. 205 / Tuesday, October 25, 2005 / Notices
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is a conventional
transmission electron microscope
(CTEM) and is intended for research or
scientific educational uses requiring a
CTEM. We know of no CTEM, or any
other instrument suited to these
purposes, which was being
manufactured in the United States
either at the time of order of each
instrument OR at the time of receipt of
application by U.S. Customs and Border
Protection.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs
Staff.
[FR Doc. E5–5893 Filed 10–24–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
(C–427–603)
Preliminary Results of Full Sunset
Review: Brass Sheet and Strip from
France
Import Administration,
International Trade Administration,
Department of Commerce.
SUMMARY: On April, 1, 2005, the
Department of Commerce (‘‘the
Department’’) initiated a sunset review
of the countervailing duty (‘‘CVD’’)
order on brass sheet and strip from
France, pursuant to section 751(c) of the
Tariff Act of 1930, as amended (‘‘the
Act’’). On the basis of a notice of intent
to participate and an adequate
substantive response filed on behalf of
the domestic interested parties and an
adequate response from respondent
interested parties, the Department
determined to conduct a full sunset
review of this CVD order pursuant to
section 751(c) of the Act and 19 CFR
351.218(e)(2). As a result of our
analysis, the Department preliminarily
finds that revocation of the CVD order
would likely to lead to continuation or
recurrence of a countervailable subsidy
at the level indicated in the
‘‘Preliminary Results of Review’’ section
of this notice.
EFFECTIVE DATE: October 25, 2005.
FOR FURTHER INFORMATION CONTACT:
Darla Brown or David Goldberger, AD/
CVD Operations, Import
Administration, International Trade
Administration, U.S. Department of
Commerce, 14th Street & Constitution
Avenue NW, Washington, DC 20230;
telephone: (202) 482–2849 or (202) 482–
4136, respectively.
SUPPLEMENTARY INFORMATION:
AGENCY:
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Background
On April 1, 2005, the Department
initiated a sunset review of the CVD
order on brass sheet and strip from
France pursuant to section 751(c) of the
Act. See Notice of Initiation of Five-year
(‘‘Sunset’’) Reviews, 70 FR 16800 (April
1, 2005). The Department received a
notice of intent to participate from the
following domestic interested parties:
Heyco Metals, Inc. (‘‘Heyco’’); Olin
Corporation – Brass Group (‘‘Olin’’);
Outokumpu American Brass
(‘‘Outokumpu’’); PMX Industries, Inc.
(‘‘PMX’’); Revere Copper Products, Inc.
(‘‘Revere’’); Scott Brass (‘‘Scott’’); the
International Association of Machinists
and Aerospace Workers; United Auto
Workers (Local 2367 and Local 1024);
and United Steelworkers of America
(AFL/CIO–CLC) (hereinafter,
collectively ‘‘domestic interested
parties’’), within the deadline specified
in 19 CFR 351.218(d)(1)(i). The
domestic interested parties claimed
interested party status under sections
771(9)(C) and (D) of the Act, as domestic
brass mills, rerollers, and unions
engaged in the production of brass sheet
and strip in the United States.
The Department received substantive
responses from the domestic interested
parties as well as from Gravograph
Industrie International (‘‘Gravograph’’);
Trefimetaux, S.A. (‘‘TMX’’); and the
Government of France (‘‘GOF’’). On May
24, 2005, after analyzing the substantive
and rebuttal responses of interested
parties, consistent with 19 CFR
351.218(e)(1)(ii)(A) and (C), the
Department determined to conduct an
expedited review of this countervailing
duty order on the basis that the two
respondent companies, Gravograph and
TMX, accounted for less than 50 percent
of the exports of subject merchandise
from France to the United States during
the sunset review period.
Subsequently, the GOF and the
European Union (‘‘EU’’) requested that
the Department reconsider its adequacy
determination on the basis that the
customs data concerning imports (U.S.
data) and exports (French data) do not
reliably reflect the actual volume of
imports of brass sheet and strip.1 On
June 10, 2005, domestic interested
parties submitted a letter reiterating
earlier comments asserting that the
French respondents failed to submit all
of the required information in their
responses and failed to satisfy the 50–
percent export threshold set forth in the
regulations. Thus, according to domestic
interested parties, the Department’s
determination to conduct an expedited
1 See letters of June 8, 2005, and June 9, 2005,
respectively.
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review was correct and should be
maintained.
On June 14, 2005, the Department met
with representatives from the EU and
the GOF to discuss their request that the
Department reconsider its decision to
conduct an expedited review in the
instant case.2 On July 11, 2005, the GOF
provided additional information
concerning the statistics on French brass
sheet and strip and again requested that
the Department reconsider its adequacy
determination. On July 13, 2005, the EU
expressed its support for the GOF’s
request for a full sunset review noting
that, in view of the manifest
discrepancies in the various sources of
data, for which the GOF has been pro–
active in trying to find a solution, it
would be wrong to deny all the parties
a full and comprehensive investigation
of the facts. Finally, on July 14, 2005,
the domestic interested parties
reiterated the view that the Department
should conduct an expedited sunset
review in this proceeding arguing that
no justification exists for the
Department to reverse its earlier
conclusion.
The Department determined that the
sunset review of the CVD order on brass
sheet and strip from France is
extraordinarily complicated. In
accordance with section 751(c)(5)(C)(v)
of the Act, the Department may treat a
review as extraordinarily complicated if
it is a review of a transition order (i.e.,
an order in effect on January 1, 1995).
(See section 751(c)(6)(C) of the Act.)
Therefore, on July 27, 2005, the
Department extended the time limit for
the completion of the final results of
this review until not later than October
28, 2005, in accordance with section
751(c)(5)(B) of the Act. See Brass Sheet
and Strip from Germany, Brazil, and
France: Extension of Final Results of
Expedited Sunset Review of the
Antidumping and Countervailing Duty
Orders, 70 FR 43395 (July 27, 2005).
However, when the Department
determined to conduct a full sunset
review of this order, the preliminary
results of the full sunset review were
extended until October 18, 2005.
Scope of the Order
The merchandise subject to the CVD
order is coiled, wound–on-reels
(traverse wound), and cut–to-length
2 See June 16, 2005, Memorandum to the File,
From Kelly Parkhill, concerning the Sunset Review
of the Countervailing Duty Order on Brass Sheet
and Strip from France.
The Department reconsidered its original
determination, and, on August 12, 2005,
determined to conduct a full review of this order,
as provided for at section 751(c)(5)(A) and (C) of the
Tariff Act of 1930 and at 19 CFR 351.218(e)(2).
E:\FR\FM\25OCN1.SGM
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Agencies
[Federal Register Volume 70, Number 205 (Tuesday, October 25, 2005)]
[Notices]
[Pages 61603-61604]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-5893]
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DEPARTMENT OF COMMERCE
International Trade Administration
State University of New York, Stony Brook, et al., Notice of
Consolidated Decision on Applications for Duty-Free Entry of Electron
Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court
Building, U.S. Department of Commerce, 1099 14th Street, NW,
Washington, D.C.
Docket Number: 05-032. Applicant: State University of New York,
Stony Brook. Instrument: Electron Microscope, Model JEM-2200FS.
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR
48372, August 17, 2005. Order Date: September 2, 2003.
Docket Number: 05-034. Applicant: The University of Southern
Mississippi, Hattiesburg. Instrument: Electron Microscope, Model JEM-
2100. Manufacturer: JEOL, Ltd., Japan. Intended Use:See notice at 70 FR
48372, August 17, 2005. Order Date: October 13, 2004.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United
[[Page 61604]]
States at the time the instruments were ordered. Reasons: Each foreign
instrument is a conventional transmission electron microscope (CTEM)
and is intended for research or scientific educational uses requiring a
CTEM. We know of no CTEM, or any other instrument suited to these
purposes, which was being manufactured in the United States either at
the time of order of each instrument OR at the time of receipt of
application by U.S. Customs and Border Protection.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs Staff.
[FR Doc. E5-5893 Filed 10-24-05; 8:45 am]
BILLING CODE 3510-DS-S