Johns Hopkins University, School of Medicine, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 20355 [E5-1846]
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Federal Register / Vol. 70, No. 74 / Tuesday, April 19, 2005 / Notices
The demographic information
provides a unique set of data on selected
characteristics for the civilian
noninstitutional population. Some of
the demographic information we collect
is age, marital status, gender, Armed
Forces status, education, race, origin,
and family income. We use these data
in conjunction with other data,
particularly the monthly labor force
data, as well as periodic supplement
data. We use these data also
independently for internal analytic
research and for evaluation of other
surveys. In addition, we need these data
to correctly control estimates of other
characteristics to the proper proportions
of age, gender, race, and origin.
We use the data from the CPS on
household size and composition, age,
education, ethnicity, and marital status
to compile monthly averages or other
aggregates for national and subnational
estimates. We use these data in four
principal ways: In association with
other data, such as monthly labor force
or periodic supplement publications; for
internal analytic research; for evaluation
of other surveys and survey results; and
as a general purpose sample and survey.
Affected Public: Individuals or
households.
Frequency: Monthly.
Respondent’s Obligation: Voluntary.
Legal Authority: Title 13, United
States Code, Section 182.
OMB Desk Officer: Susan Schechter,
(202) 395–5103.
Copies of the above information
collection proposal can be obtained by
calling or writing Diana Hynek,
Departmental Paperwork Clearance
Officer, (202) 482–0266, Department of
Commerce, room 6625, 14th and
Constitution Avenue, NW, Washington,
DC 20230 (or via the Internet at
dhynek@doc.gov).
Written comments and
recommendations for the proposed
information collection should be sent
within 30 days of publication of this
notice to Susan Schechter, OMB Desk
Officer either by fax (202–395–7245) or
e-mail (susan_schechter@omb.eop.gov).
Dated: April 15, 2005.
Madeleine Clayton,
Management Analyst, Office of the Chief
Information Officer.
[FR Doc. 05–7779 Filed 4–18–05; 8:45 am]
BILLING CODE 3510–07–P
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DEPARTMENT OF COMMERCE
Foreign–Trade Zones Board
[T–1–2005]
Foreign–Trade Zone 61 San Juan,
Puerto Rico, Application for
Temporary/Interim Manufacturing
Authority, Shell Chemicals Yabucoa,
Inc., (Petrochemical Complex), Notice
of Approval
On February 11, 2005, an application
was filed by the Executive Secretary of
the Foreign–Trade Zones (FTZ) Board
by the Puerto Rico Trade and Exports
Company, grantee of FTZ 61, requesting
temporary/interim manufacturing (T/
IM) authority for certain petroleum and
petrochemical products within Subzone
61I, at the Shell Chemicals Yabucoa,
Inc. petrochemical complex in Yabucoa,
Puerto Rico.
The application has been processed in
accordance with T/IM procedures, as
authorized by FTZ Board Order 1347,
including notice in the Federal Register
inviting public comment (70 FR 9614–
9615, 2/28/05). The FTZ staff examiner
reviewed the application and
determined that it meets the criteria for
approval under T/IM procedures.
Pursuant to the authority delegated to
the FTZ Board Executive Secretary in
Board Order 1347, the application is
approved, effective this date, until April
11, 2007, subject to the FTZ Act and the
Board’s regulations, including Section
400.28.
Dated: April 11, 2005.
Dennis Puccinelli,
Executive Secretary.
[FR Doc. 05–7792 Filed 4–18–05; 8:45 am]
BILLING CODE: 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
Johns Hopkins University, School of
Medicine, et al., Notice of Consolidated
Decision on Applications for Duty–
Free Entry of Electron Microscopes
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, 80 Stat. 897; 15 CFR part
301). Related records can be viewed
between 8:30 A.M. and 5:00 P.M. in
Suite 4100W, Franklin Court Building,
U.S. Department of Commerce, 1099
14th Street, NW, Washington, D.C.
Docket Number: 05–011. Applicant:
Johns Hopkins University, School of
Medicine, Baltimore, MD 21205.
Instrument: Electron Microscope, Model
PO 00000
Frm 00011
Fmt 4703
Sfmt 4703
20355
H–7600–I. Manufacturer: Hitachi High–
Technologies Corporation, Japan.
Intended Use: See notice at 70 FR
13011, March 17, 2005. Order Date: July
27, 2004.
Docket Number: 05–013. Applicant:
National Institute of Standards and
Technology, Gaithersburg, MD 20899.
Instrument: Electron Microscope, Model
Nova 600 Nanolab. Manufacturer: FEI
Company, The Netherlands. Intended
Use: See notice at 70 FR 13011, March
17, 2005. Order Date: September 23,
2004.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses. We know of no
electron microscope, or any other
instrument suited to these purposes,
which was being manufactured in the
United States either at the time of order
of each instrument OR at the time of
receipt of application by U.S. Customs
and Border Protection.
Gerald A. Zerdy,
Program Manager Statutory Import Programs
Staff.
[FR Doc. E5–1846 Filed 4–18–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
University of Chicago, Notice of
Decision on Application for Duty–Free
Entry for Scientific Instrument
This decision is made pursuant to
Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 A.M. and 5:00 P.M. in Suite
4100W, U.S. Department of Commerce,
Franklin Court Building, 1099 14th
Street, NW, Washington, D.C.
Docket Number: 05–012. Applicant:
University of Chicago, Chicago, IL
60637. Instrument: Pattern Selection
Triggers (63). Manufacturer: Hytec
Electronics, Ltd., United Kingdom.
Intended Use: See notice at 70 FR
13011, March 17, 2005. Comments:
None received. Decision: Approved. No
apparatus of equivalent scientific value
to the foreign apparatus, for such
purposes as it is intended to be used, is
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[Federal Register Volume 70, Number 74 (Tuesday, April 19, 2005)]
[Notices]
[Page 20355]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-1846]
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DEPARTMENT OF COMMERCE
International Trade Administration
Johns Hopkins University, School of Medicine, et al., Notice of
Consolidated Decision on Applications for Duty-Free Entry of Electron
Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court
Building, U.S. Department of Commerce, 1099 14th Street, NW,
Washington, D.C.
Docket Number: 05-011. Applicant: Johns Hopkins University, School
of Medicine, Baltimore, MD 21205. Instrument: Electron Microscope,
Model H-7600-I. Manufacturer: Hitachi High-Technologies Corporation,
Japan. Intended Use: See notice at 70 FR 13011, March 17, 2005. Order
Date: July 27, 2004.
Docket Number: 05-013. Applicant: National Institute of Standards
and Technology, Gaithersburg, MD 20899. Instrument: Electron
Microscope, Model Nova 600 Nanolab. Manufacturer: FEI Company, The
Netherlands. Intended Use: See notice at 70 FR 13011, March 17, 2005.
Order Date: September 23, 2004.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses. We know of no
electron microscope, or any other instrument suited to these purposes,
which was being manufactured in the United States either at the time of
order of each instrument OR at the time of receipt of application by
U.S. Customs and Border Protection.
Gerald A. Zerdy,
Program Manager Statutory Import Programs Staff.
[FR Doc. E5-1846 Filed 4-18-05; 8:45 am]
BILLING CODE 3510-DS-S
