Applications for Duty-Free Entry of Scientific Instruments, 13011 [E5-1172]
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Federal Register / Vol. 70, No. 51 / Thursday, March 17, 2005 / Notices
Related records can be viewed between
8:30 a.m. and 5 p.m. in Suite 4100W,
U.S. Department of Commerce, Franklin
Court Building, 1099 14th Street, NW.,
Washington, DC.
Docket Number: 05–002.
Applicant: Cornell University, Ithaca,
NY 14853.
Instrument: KB Mirror System.
Manufacturer: Khozu Precision Co.,
Ltd., Japan.
Intended Use: See notice at 70 FR
February 7, 2005.
Comments: None received.
Decision: Approved. No apparatus of
equivalent scientific value to the foreign
apparatus, for such purposes as it is
intended to be used, is being
manufactured in the United States.
Reason: This is a compatible
accessory for an existing instrument
purchased for the use of the applicant.
The accessory is pertinent to the
intended uses and we know of no
domestic accessory which can be
readily adapted for use with the existing
instrument.
Instrument: Electron microscope,
Model H–7600–I.
Manufacturer: Hitachi HighTechnologies Corporation, Japan.
Intended Use: The instrument is
intended to be used to investigate:
(1) The mechanical properties of
intermediate filaments composed of
keratin;
(2) The structure and replication
mechanism of kinoplast DNA;
(3) The basis of bacterial gliding
motility by means of slime expulsion in
certain prokaryotic cells;
(4) The mechanism of membrane
protein delivery to the plasma
membrane in mammalian cells;
(5) Identification of novel genes that
play critical roles in the development of
the retina.
Application accepted by
Commissioner of Customs: February 25,
2005.
Applications for Duty-Free Entry of
Scientific Instruments
Docket Number: 05–012.
Applicant: University of Chicago, 933
East 56th Street, Chicago, IL 60637.
Instrument: Pattern Selection Trigger.
Manufacturer: Hytec Electronics, Ltd.,
United Kingdom.
Intended Use: The instrument is
intended to be used, in conjunction
with a digital computer system, for a
telescope to study high-energy gammarays of astronomical origin.
Application accepted by
Commissioner of Customs: February 28,
2005.
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether instruments of
equivalent scientific value, for the
purposes for which the instruments
shown below are intended to be used,
are being manufactured in the United
States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce, Washington,
DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m.
in Suite 4100W, U.S. Department of
Commerce, Franklin Court Building,
1099 14th Street, NW., Washington, DC.
Docket Number: 00–011.
Applicant: Johns Hopkins University,
School of Medicine, Microscope
Facility, 725 N. Wolfe Street, Physiology
Building, Room G–4, Baltimore, MD
21205.
Docket Number: 05–013.
Applicant: National Institute of
Standards and Technology.
Instrument: Focused Ion Beam Field
Emission Scanning Electron
Microscope, Model Nova 600 NanoLab.
Manufacturer: FEI Company, The
Netherlands.
Intended Use: The instrument is
intended to allow complex, chemically
heterogeneous materials to be both
synthesized using materials deposition
from gas injection systems, and to be
sectioned and ion milled using a
Gallium ion beam for removal of
material for study of the gross
morphology, crystal structure and
microstructure, chemical composition,
electronic structure, and transport
properties of materials to be measured
on nanometer length scales. The
phenomena of electron scattering, x-ray
generation, beam transport, absorption
and internal fluoresence will be studied
to perform quantitative analyses of
nanoscale materials for numerous
ongoing research projects.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E5–1173 Filed 3–16–05; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
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14:51 Mar 16, 2005
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13011
Application accepted by
Commissioner of Customs: March 2,
2005.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E5–1172 Filed 3–16–05; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
Submission for OMB Review;
Comment Request
The Department of Commerce has
submitted to the Office of Management
and Budget (OMB) for clearance the
following proposal for collection of
information under the provisions of the
Paperwork Reduction Act (44 U.S.C.
Chapter 35).
Agency: National Oceanic and
Atmospheric Administration (NOAA).
Title: Southwest Region Permit
Family of Forms—Pacific.
Form Number(s): None.
OMB Approval Number: 0648–0490.
Type of Request: Regular submission.
Burden Hours: 85.
Number of Respondents: 200.
Average Hours per Response: 23
minutes.
Needs and Uses: The permits are
required for persons to participate in
federally-managed fisheries in the
western Pacific region and off the U.S.
West Coast. The Western Pacific Fishery
Management Council has recommended
the National Marine Fisheries Service’s
(NMFS) approval and implementation
of Amendment 11 to the Fishery
Management Plan for the Pelagic
Fisheries of the Western Pacific Region.
Amendment 11 would establish a
limited access permit program for the
American Samoa-based pelagic longline
fishery which necessitates a revised
collection of information. The program
requires information from potential
initial participants and subsequent new
entrants (via permit transfers) in the
fishery. NMFS will use the information
to determine who is eligible for issuance
of American Samoa longline limited
access permits. The fishermen will be
required to use appropriate permit
application forms/supplementary
information sheets provided by NMFS.
Affected Public: Business or other forprofit organizations; Individuals or
households.
Frequency: Variable.
Respondent’s Obligation: Mandatory.
OMB Desk Officer: David Rostker,
(202) 395–3897.
Copies of the above information
collection proposal can be obtained by
calling or writing Diana Hynek,
E:\FR\FM\17MRN1.SGM
17MRN1
]]>Agencies
[Federal Register Volume 70, Number 51 (Thursday, March 17, 2005)]
[Notices]
[Page 13011]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-1172]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat.
897; 15 CFR part 301), we invite comments on the question of whether
instruments of equivalent scientific value, for the purposes for which
the instruments shown below are intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be filed within 20 days with the Statutory Import
Programs Staff, U.S. Department of Commerce, Washington, DC 20230.
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th
Street, NW., Washington, DC.
Docket Number: 00-011.
Applicant: Johns Hopkins University, School of Medicine, Microscope
Facility, 725 N. Wolfe Street, Physiology Building, Room G-4,
Baltimore, MD 21205.
Instrument: Electron microscope, Model H-7600-I.
Manufacturer: Hitachi High-Technologies Corporation, Japan.
Intended Use: The instrument is intended to be used to investigate:
(1) The mechanical properties of intermediate filaments composed of
keratin;
(2) The structure and replication mechanism of kinoplast DNA;
(3) The basis of bacterial gliding motility by means of slime
expulsion in certain prokaryotic cells;
(4) The mechanism of membrane protein delivery to the plasma
membrane in mammalian cells;
(5) Identification of novel genes that play critical roles in the
development of the retina.
Application accepted by Commissioner of Customs: February 25, 2005.
Docket Number: 05-012.
Applicant: University of Chicago, 933 East 56th Street, Chicago, IL
60637.
Instrument: Pattern Selection Trigger.
Manufacturer: Hytec Electronics, Ltd., United Kingdom.
Intended Use: The instrument is intended to be used, in conjunction
with a digital computer system, for a telescope to study high-energy
gamma-rays of astronomical origin.
Application accepted by Commissioner of Customs: February 28, 2005.
Docket Number: 05-013.
Applicant: National Institute of Standards and Technology.
Instrument: Focused Ion Beam Field Emission Scanning Electron
Microscope, Model Nova 600 NanoLab.
Manufacturer: FEI Company, The Netherlands.
Intended Use: The instrument is intended to allow complex,
chemically heterogeneous materials to be both synthesized using
materials deposition from gas injection systems, and to be sectioned
and ion milled using a Gallium ion beam for removal of material for
study of the gross morphology, crystal structure and microstructure,
chemical composition, electronic structure, and transport properties of
materials to be measured on nanometer length scales. The phenomena of
electron scattering, x-ray generation, beam transport, absorption and
internal fluoresence will be studied to perform quantitative analyses
of nanoscale materials for numerous ongoing research projects.
Application accepted by Commissioner of Customs: March 2, 2005.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E5-1172 Filed 3-16-05; 8:45 am]
BILLING CODE 3510-DS-P
