California Department of Food and Agriculture, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 13010 [E5-1171]

Download as PDF 13010 Federal Register / Vol. 70, No. 51 / Thursday, March 17, 2005 / Notices reflect the corrected language described in both our Prelim Analysis Memo at 7 and petitioners’ February 14, 2005, Ministerial Error Allegation at 4 in the U.S. sales program, which can be found in the analysis memorandum for the amended final results. See Memorandum to the File through Abdelali Elouaradia, Program Manager, Office 7, Analysis for ThyssenKrupp Acciai Speciali Terni S.p.A. (TKAST) for the Amended Final Results of the Antidumping Duty Administrative Review of Stainless Steel Sheet and Strip in Coils from Italy, dated March 9, 2005 (Amended Final Analysis Memo). As a result of the correction of a ministerial error in the Final Results, the revised weight-averaged dumping margin is as follows: Manufacturer/exporter ThyssenKrupp Acciai Speciali Terni S.p.A. Weighted-average margin (percent) 2 3.73 See Amended Final Analysis Memo at Attachment 4 for programming details. With respect to TKAST, the Department will issue appropriate assessment instructions to U.S. Customs and Border Protection (CBP) within 15 days of publication of the amended final results of review. Accordingly, the Department will determine, and CBP will assess, antidumping duties on all entries of subject merchandise from TKAST during the period July 1, 2002, through June 30, 2003, in accordance with these amended final results. The revised cash deposit rate for TKAST shown above is effective on all shipments of the subject merchandise entered, or withdrawn from warehouse, for consumption on or after the date of publication of this notice, and will remain in effect until publication of the final results of the next administrative review. Consequently, we are issuing and publishing these amended final results and notice in accordance with sections 751(a)(1), 751(h), and 777(i) of the Act, and 19 CFR 351.224(f). Dated: March 11, 2005. Barbara E. Tillman, Acting Assistant Secretary for Import Administration. [FR Doc. E5–1167 Filed 3–16–05; 8:45 am] BILLING CODE 3510–DS–P 2 The weighted-average dumping margin previously calculated for TKAST was 3.72 percent. See Final Results, 70 FR at 7474. VerDate jul<14>2003 14:51 Mar 16, 2005 Jkt 205001 DEPARTMENT OF COMMERCE International Trade Administration California Department of Food and Agriculture, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC. Docket Number: 05–001. Applicant: California Department of Food and Agriculture, Sacramento, CA 95832. Instrument: Electron Microscope, Model H–7500–1 TEM. Manufacturer: Hitachi HighTechnologies Corp., Japan. Intended Use: See notice at 70 FR 6838, February 9, 2005. Order Date: March 29, 2004. Docket Number: 05–003. Applicant: Brigham Young University, Provo, UT 84602. Instrument: Electron Microscope, Model Technai G 2 F20 U-TWIN STEM. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 9046, February 24, 2005. Order Date: March 28, 2003. Docket Number: 05–004. Applicant: University of Delaware, Newark, DE 19716. Instrument: Electron Microscope, Model Technai G 2 12 Twin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 70 FR 9046, February 24, 2005. Order Date: May 6, 2004. Docket Number: 05–006. Applicant: University of Pittsburgh, Pittsburgh, PA 15261. Instrument: Electron Microscope, Model JEM–1011. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 10357, March 3, 2005. Order Date: March 4, 1904. Docket Number: 05–007. Applicant: Clemson University, Clemson, SC 29634. Instrument: Electron Microscope, Model H–7600. Manufacturer: Hitachi HighTechnologies Corp., Japan. Intended Use: See notice at 70 FR 10357, March 3, 2005. PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 Order Date: May 4, 2004. Docket Number: 05–008. Applicant: Rice University, Houston, TX 77005. Instrument: Electron Microscope, Model JEM–1230. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 10357, March 3, 2005. Order Date: June 25, 2004. Docket Number: 05–009. Applicant: Rice University, Houston, TX 77005. Instrument: Electron Microscope, Model JEM–2100F. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 10357, March 3,2005. Order Date: June 25, 2004. Docket Number: 05–010. Applicant: Tuskegee University, Tuskegee, AL 36008. Instrument: Electron Microscope, Model JEM–2010. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 10357, March 3, 2005. Order Date: May 19, 2004. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E5–1171 Filed 3–16–05; 8:45 am] BILLING CODE 3510–P DEPARTMENT OF COMMERCE International Trade Administration Cornell University; Notice of Decision on Application for Duty-Free Entry of Scientific Instrument This decision is made pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89– 651, 80 Stat. 897; 15 CFR part 301). E:\FR\FM\17MRN1.SGM 17MRN1

Agencies

[Federal Register Volume 70, Number 51 (Thursday, March 17, 2005)]
[Notices]
[Page 13010]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-1171]


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DEPARTMENT OF COMMERCE

International Trade Administration


California Department of Food and Agriculture, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.

    Docket Number: 05-001.
    Applicant: California Department of Food and Agriculture, 
Sacramento, CA 95832.
    Instrument: Electron Microscope, Model H-7500-1 TEM.
    Manufacturer: Hitachi High-Technologies Corp., Japan.
    Intended Use: See notice at 70 FR 6838, February 9, 2005. Order 
Date: March 29, 2004.

    Docket Number: 05-003.
    Applicant: Brigham Young University, Provo, UT 84602.
    Instrument: Electron Microscope, Model Technai G \2\ F20 U-TWIN 
STEM.
    Manufacturer: FEI Company, The Netherlands.
    Intended Use: See notice at 70 FR 9046, February 24, 2005.
    Order Date: March 28, 2003.

    Docket Number: 05-004.
    Applicant: University of Delaware, Newark, DE 19716.
    Instrument: Electron Microscope, Model Technai G \2\ 12 Twin.
    Manufacturer: FEI Company, Czech Republic.
    Intended Use: See notice at 70 FR 9046, February 24, 2005.
    Order Date: May 6, 2004.

    Docket Number: 05-006.
    Applicant: University of Pittsburgh, Pittsburgh, PA 15261.
    Instrument: Electron Microscope, Model JEM-1011.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: See notice at 70 FR 10357, March 3, 2005.
    Order Date: March 4, 1904.

    Docket Number: 05-007.
    Applicant: Clemson University, Clemson, SC 29634.
    Instrument: Electron Microscope, Model H-7600.
    Manufacturer: Hitachi High-Technologies Corp., Japan.
    Intended Use: See notice at 70 FR 10357, March 3, 2005.
    Order Date: May 4, 2004.

    Docket Number: 05-008.
    Applicant: Rice University, Houston, TX 77005.
    Instrument: Electron Microscope, Model JEM-1230.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: See notice at 70 FR 10357, March 3, 2005.
    Order Date: June 25, 2004.

    Docket Number: 05-009.
    Applicant: Rice University, Houston, TX 77005.
    Instrument: Electron Microscope, Model JEM-2100F.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: See notice at 70 FR 10357, March 3,2005.
    Order Date: June 25, 2004.

    Docket Number: 05-010.
    Applicant: Tuskegee University, Tuskegee, AL 36008.
    Instrument: Electron Microscope, Model JEM-2010.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: See notice at 70 FR 10357, March 3, 2005.
    Order Date: May 19, 2004.
    Comments: None received.
    Decision: Approved. No instrument of equivalent scientific value to 
the foreign instrument, for such purposes as these instruments are 
intended to be used, was being manufactured in the United States at the 
time the instruments were ordered.
    Reasons: Each foreign instrument is a conventional transmission 
electron microscope (CTEM) and is intended for research or scientific 
educational uses requiring a CTEM. We know of no CTEM, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States either at the time of order of each instrument OR at 
the time of receipt of application by U.S. Customs and Border 
Protection.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E5-1171 Filed 3-16-05; 8:45 am]
BILLING CODE 3510-P
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