National Institute of Standards and Technology June 2006 – Federal Register Recent Federal Regulation Documents
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Announcement of a Meeting To Explore Feasibility of Establishing a NIST/Industry Consortium on Metrological Aspects of X-Ray Diffraction and X-Ray Reflectometry Analysis
The National Institute of Standards and Technology (NIST) invites interested parties to attend a pre-consortium meeting to be held on August 10, 2006 in conjunction with the 55th Annual Denver X- Ray Conference at the Denver Marriott Tech Center Hotel, in Denver, CO. The objective of this meeting is to evaluate industry interest in a NIST/Industry Consortium on metrological aspects of X-Ray Diffraction and X-Ray Reflectometry analysis. The goals of this consortium include the development of standardized terminology and modeling methods, which will facilitate parameter comparisons between different instrument software and improve customer confidence in X-ray characterization techniques. The approach will compare results from industrial X-ray modeling and refinement approaches with NIST X-ray metrology-based approaches to establish consistency in parameter determination and in uncertainty analysis. The long-term goal of this collaboration will be NIST recommendations for X-ray data measurement and analysis methods. Recommended measurement and analysis methods in conjunction with future Standard Reference Materials will establish SI traceability between X-ray measurement and structural model parameters. NIST staff members along with at least one technical representative from each participating member company will conduct X-ray software data refinements. Membership in the Consortium is open to the X-ray instrument vendor community, particularly equipment manufacturers with commercially available X-ray analysis software applicable to the comparative study. The term of the consortium is intended to be 5 years.
National Conference on Weights and Measures: Annual Meeting
The Annual Meeting of the 91st National Conference on Weights and Measures (NCWM) will be held July 9 to 13, 2006, in Chicago, Illinois. This meeting is open to the public. Detailed meeting agendas and information on registration requirements, fees and hotel information can be found at https://www.ncwm.net. The NCWM is an organization of weights and measures officials of the states, counties, and cities of the United States, Federal Agencies, and private sector representatives. This meeting brings together government officials and representatives of business, industry, trade associations, and consumer organizations to consider subjects related to the field of weights and measures technology, administration, and enforcement. Pursuant to (15 U.S.C. 272(b)(6)), the National Institute of Standards and Technology supports the National Conference on Weights and Measures in order to promote uniformity among the States in the complexity of laws, regulations, methods, and testing equipment that comprises regulatory control by the states of commercial weighing and measuring. Publication of this notice by the NIST on the NCWM's behalf is being undertaken as a public service; NIST does not necessarily endorse, approve, or recommend any of the proposals contained in the notice.
Proposed Information Collection; Comment Request; Advanced Technology Program Business Reporting System
The Department of Commerce (DOC), as part of its continuing effort to reduce paperwork and respondent burden, invites the general public and other Federal agencies to comment on the continuing and proposed information collection, as required by the Paperwork Reduction Act of 1995, Public Law 104-13 (44 U.S.C. 3506(c)(2)(A)).